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Volumn 430, Issue 1, 1999, Pages 154-164
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Si(001) c(4 × 4) surface reconstruction: a comprehensive experimental study
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CARBON;
CRYSTAL DEFECTS;
DIMERS;
ELECTRIC POTENTIAL;
IMPURITIES;
LOW ENERGY ELECTRON DIFFRACTION;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING SILICON;
TENSILE STRESS;
DIMER VACANCY;
SURFACE RECONSTRUCTION;
SURFACES;
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EID: 0037780734
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00430-6 Document Type: Article |
Times cited : (54)
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References (53)
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