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Volumn 430, Issue 1, 1999, Pages 154-164

Si(001) c(4 × 4) surface reconstruction: a comprehensive experimental study

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CARBON; CRYSTAL DEFECTS; DIMERS; ELECTRIC POTENTIAL; IMPURITIES; LOW ENERGY ELECTRON DIFFRACTION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; TENSILE STRESS;

EID: 0037780734     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00430-6     Document Type: Article
Times cited : (54)

References (53)
  • 48
    • 85031635857 scopus 로고
    • L.C. Kimerling, Parsey J.M. Warrendale: The Metallurgical Society
    • Bourret A. Kimerling L.C., Parsey J.M. 1985;129 The Metallurgical Society, Warrendale.
    • (1985) , pp. 129
    • Bourret, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.