Characterization of organic thin film materials with Near-field Scanning Optical Microscopy (NSOM)

Annual Review of Materials Science

Volumn 29, Issue , 1999, Pages 433-469

  Barbara, P F ^a   Adams, D M ^a   O'Connor, D B ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; BIOLOGICAL MATERIALS; CHARACTERIZATION; MOLECULAR CRYSTALS; MORPHOLOGY; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; ORGANIC POLYMERS; SCANNING; SEMICONDUCTOR JUNCTIONS;

MOLECULAR AGGREGATES; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

THIN FILMS;

EID: 0033300955     PISSN: 00846600     EISSN: None     Source Type: Book    
DOI: 10.1146/annurev.matsci.29.1.433     Document Type: Book

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