Imaging of refractive index change by the reflection-mode scattering-type scanning near-field optical microscope: Simulation and observations

Journal of Applied Physics

Volumn 85, Issue 4, 1999, Pages 2026-2030

  Sasaki, Hiroko ^a   Sasaki, Yasuo ^a  

^a OLYMPUS CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000625215     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369497     Document Type: Article

References (13)

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