Near-field optical microscopy of localized excitations on rough surfaces: Influence of a probe

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 561-566

  Bozhevolnyi, S I ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Multiple scattering; Near field optics; Probe sample interaction; Scanning near field optical microscopy

Indexed keywords

OPTICAL DATA STORAGE; PROBES;

INTENSITY DISTRIBUTION; LOCALISED; LOCALIZED EXCITATIONS; MULTIPLE-SCATTERING; NEAR FIELD OPTICAL MICROSCOPY; NEAR FIELD OPTICS; PROBE-SAMPLE INTERACTIONS; ROUGH SURFACES; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SURFACE INFLUENCES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

CONFERENCE PAPER; IMAGE QUALITY; LIGHT SCATTERING; MICROSCOPY; OPTICS; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SIGNAL DETECTION;

EID: 0033059846     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00501.x     Document Type: Conference Paper

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