Polarization contrast with an apertureless near-field optical microscope

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 327-331

  Adam, P M ^a   Royer, P ^a   Laddada, R ^a   Bijeon, J L ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

Near field optics; Polarization; Scanning probe microscopy; SNOM

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIGHT; MICROSCOPES; OPTICS; POLARIZATION;

NEAR FIELD OPTICAL MICROSCOPE; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

ARTICLE; ARTIFACT; ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; LIGHT SCATTERING; MICROSCOPY; OPTICS; POLARIZATION; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0032033554     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00091-0     Document Type: Article

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