A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope

Review of Scientific Instruments

Volumn 69, Issue 4, 1998, Pages 1735-1743

  Wurtz, G ^a   Bachelot, R ^a   Royer, P ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; EQUIPMENT TESTING; GLASS; LIGHTING; MICROSCOPES; OPTICAL DEVICES; OPTICAL FIBERS; POLARIZATION; PROBES; SEMICONDUCTOR LASERS;

DIELECTRIC PROBE; METALLIC PROBE; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCANNING PROBE MICROSCOPE; SEMICONDUCTING PROBE;

OPTICAL MICROSCOPY;

EID: 0032049270     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148834     Document Type: Article

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