3D simulations of the experimental signal measured in near-field optical microscopy

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 235-239

  Martin, O J F ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

Artefacts; Contrast mechanisms; Image formation; Local probe microscopy; Near field optics; Polarization; Simulations; Theory; Topography

Indexed keywords

METAL COATINGS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE;

3D SIMULATIONS; ARTIFACT; CONTRAST MECHANISM; LOCAL PROBE MICROSCOPY; LOCAL PROBES; NEAR FIELD OPTICAL MICROSCOPY; NEAR FIELD OPTICS; PROBE MICROSCOPY; SIMULATION; THEORY;

POLARIZATION;

ARTIFACT; CONFERENCE PAPER; CONTRAST ENHANCEMENT; IMAGE RECONSTRUCTION; MICROSCOPE IMAGE; POLARIZATION; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; THREE DIMENSIONAL IMAGING;

EID: 0033029148     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00560.x     Document Type: Conference Paper

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