The infrared optical functions of AlxGa1-xN determined by reflectance spectroscopy

Applied Physics Letters

Volumn 73, Issue 11, 1998, Pages 1472-1474

  Yu, G ^a   Ishikawa, H ^a   Umeno, M ^a   Egawa, T ^a   Watanabe, J ^a   Soga, T ^a   Jimbo, T ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; ELLIPSOMETRY; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PERMITTIVITY; PHONONS; SPECTROSCOPY; SUBSTRATES; TEMPERATURE; THERMODYNAMIC PROPERTIES;

INFRARED OPTICAL FUNCTIONS; KRAMERS-KRONIG ANALYSIS; REFLECTANCE SPECTROSCOPY; SPECTROSCOPIC ELLIPSOMETRY;

SEMICONDUCTING ALUMINUM COMPOUNDS;

EID: 0032516990     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122177     Document Type: Article

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