Study of the electrical characteristics of various metals on p-type GaN for Ohmic contacts

Journal of Electronic Materials

Volumn 28, Issue 5, 1999, Pages 572-579

  Fung, A K ^a   Borton, J E ^a   Nathan, M I ^a   Van Hove, J M ^b   Hickman II, R ^b   Chow, P P ^b   Wowchak, A M ^b  

^a University of Minnesota   (United States)

^b SVT ASSOCIATES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; COPPER; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; INDIUM; MAGNESIUM; MANGANESE; NICKEL; OHMIC CONTACTS; SEMICONDUCTING GALLIUM COMPOUNDS; ZINC;

CONTACT RESISTANCE; ELECTRICAL CHARACTERISTICS; ELECTRICAL STABILITY; THERMAL AGING;

TRANSITION METALS;

EID: 0032682604     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-999-0115-x     Document Type: Article

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