SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 308-309, Issue 1-4, 1997, Pages 599-606

A survey of ohmic contacts to III-V compound semiconductors

(5) Baca, A G a Ren, F b Zolper, J C a Briggs, R D a Pearton, S J c

a SANDIA NATIONAL LABORATORIES (United States)

b NOKIA RESEARCH CENTER (United States)

c UNIVERSITY OF FLORIDA (United States)

Author keywords

Alloys; Contact materials; Properties; Semiconductors

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; ENERGY GAP; GOLD ALLOYS; INTERFACES (MATERIALS); IONIZATION OF SOLIDS; METALLIZING; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DOPING; THERMODYNAMIC STABILITY;

SOLID PHASE REGROWTH;

OHMIC CONTACTS;

EID: 0031245697 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00439-2 Document Type: Article

Times cited : (204)

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