Thermal stability of Pt, Pd, Ni on GaN

Materials Research Society Symposium - Proceedings

Volumn 449, Issue , 1997, Pages 1049-1054

  Duxstad, K J ^a   Haller, E E ^a   Yu, K M ^a   Hirsch, M T ^a   Imler, W R ^a   Steigerwald, D A ^a   Ponce, F A ^a   Romano, L T ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; NICKEL; PLATINUM METALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM COMPOUNDS; THERMODYNAMIC STABILITY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURE; NITRIDE SEMICONDUCTORS; SCHOTTKY CONTACTS; SURFACE BEHAVIOR;

SEMICONDUCTOR METAL BOUNDARIES;

EID: 0030681092     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)