Cr/Ni/Au ohmic contacts to the moderately-doped p- and n-GaN

Materials Research Society Symposium - Proceedings

Volumn 449, Issue , 1997, Pages 1061-1065

  Kim, T ^a,a   Yoo, M C ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; ELECTRIC CONDUCTIVITY OF SOLIDS; GOLD; METALLIZING; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NICKEL; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DOPING;

CONTACT RESISTIVITY; NITRIDE SEMICONDUCTORS; TRILAYER METALLIZATION SCHEMES;

OHMIC CONTACTS;

EID: 0030711976     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)