Comparison and investigation of ohmic characteristics in the Ni/AuZn and Cr/AuZn metal schemes

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 9 A, 1998, Pages 4667-4671

  Youn, Doo Hyeb ^a   Hao, Maosheng ^a   Naoi, Yoshiki ^a   Mahanty, Sourindra ^a   Sakai, Shiro ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

GaN:Cr alloy; GaN:Ni alloy; Ohmic contact; p GaN; Zn diffusion

Indexed keywords

ANNEALING; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; HEAT TREATMENT; INTERFACES (MATERIALS); METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; OHMIC CONTACTS; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING GALLIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

GALLIUM NITRIDE; INTERFACIAL MICROSTRUCTURE; INTERFACIAL REACTIONS; LOW RESISTANCE OHMIC CONTACT;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0032154560     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.4667     Document Type: Review

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