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Volumn 11, Issue 3, 1998, Pages 379-394

Evolution and progress of deep uv resist materials

Author keywords

Acid catalysis; Arf excimer laser; Chemical amplification resists; Deep uv lithography; Krf excimcr laser; Photochemical acid generators

Indexed keywords


EID: 0001382530     PISSN: 09149244     EISSN: None     Source Type: Journal    
DOI: 10.2494/photopolymer.11.379     Document Type: Article
Times cited : (34)

References (105)
  • 84
    • 33745544187 scopus 로고    scopus 로고
    • 3049 (1997) 282.
    • W. Conley, B. Brunsvold, F. Buehrer, R. Dellaguardia, D. Dobuzinsky, T. Farrell, H. Ho, A. Katnani, R. Keller, J. Marsh, P. Muller, R. Nunes, H. Ng, J. Oberschmidt, M. Pike, D. Ryan, T. Cotler-Wagner, R. Schulz, H. Ito, D. Hofer, G. Breyta, D. Fenzel-Alexander, G. Wallraff, J. Opitz, J. Thackeray, G. Barclay, J. Cameron, T. Lindsay, M. Cronin, M. Moynihan, S. Nour, J. Geroger, M. Mon, P. Hagerty, R. Sinta, and T. Zydowsky, Proc. SPIE, 3049 (1997) 282.
    • Proc. SPIE
    • Conley, W.1    Brunsvold, B.2    Buehrer, F.3    Dellaguardia, R.4    Dobuzinsky, D.5    Farrell, T.6    Ho, H.7    Katnani, K.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.