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Volumn 124, Issue 10, 1977, Pages 1648-1651
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Poly (Fluoro Methacrylate) as Highly Sensitive, High Contrast Positive Resist
a a a a
a
NTT CORPORATION
(Japan)
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Author keywords
polymer resist; positive resist; x ray lithography
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Indexed keywords
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EID: 84957494094
PISSN: 00134651
EISSN: 19457111
Source Type: Journal
DOI: 10.1149/1.2133127 Document Type: Article |
Times cited : (56)
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References (10)
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