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Volumn 124, Issue 10, 1977, Pages 1648-1651

Poly (Fluoro Methacrylate) as Highly Sensitive, High Contrast Positive Resist

Author keywords

polymer resist; positive resist; x ray lithography

Indexed keywords


EID: 84957494094     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/1.2133127     Document Type: Article
Times cited : (56)

References (10)
  • 7
    • 84943708572 scopus 로고
    • Paper presented at the 30th Annual Meeting of the Chemical Society of Japan
    • K. Sekikawa and S. Aoyama, Paper presented at the 30th Annual Meeting of the Chemical Society of Japan (1974).
    • (1974)
    • Sekikawa, K.1    Aoyama, S.2
  • 8
    • 84975442783 scopus 로고
    • J.H. Helbert, P.J. Caplan, and E.H. Poindexter, J. Appl. Poly. Sci., 21, 797 (1977).
    • J.N. Helbert, C.F. Cook, Jr., and E.H. Poindexter, Journal of the Electrochemical Society, 124, 158 (1977); J.H. Helbert, P.J. Caplan, and E.H. Poindexter, J. Appl. Poly. Sci., 21, 797 (1977).
    • (1977) Journal of the Electrochemical Society , vol.124 , pp. 158
    • Helbert, J.N.1    Cook, C.F.2    Poindexter, E.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.