Structural origin of resistance drift in amorphous GeTe

Physical Review B

Volumn 93, Issue 11, 2016, Pages

  Zipoli, Federico ^a   Krebs, Daniel ^a   Curioni, Alessandro ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84960926065     PISSN: 24699950     EISSN: 24699969     Source Type: Journal    
DOI: 10.1103/PhysRevB.93.115201     Document Type: Article

References (85)

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