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note
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We thank Y. Xiao, M. Jurich, Y.-C. Chen, M. Salinga, and M. Hitzbleck for their help with thin-film growth and thermal treatments. This material is based on work conducted under IBM-UIUC joint study agreement and is supported by NSF under awards DMR 04-12939 and DMR 07-06267. The FTEM technique was available thanks to collaborative support under award DMR 06-05890. FTEM, AFM, and thermal treatments were carried out, in part, in the Frederick Seitz Materials Research Laboratory Central Facilities, University of Illinois, which are partially supported by the U.S. Department of Energy under grants DE-FG02-07ER46453 and DE-FG02-07ER46471.
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