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Volumn 104, Issue 8, 2010, Pages

Signature of tetrahedral Ge in the Raman spectrum of amorphous phase-change materials

(5) Mazzarello, Riccardo a,c Caravati, Sebastiano a,b Angioletti Uberti, Stefano b,d Bernasconi, Marco b Parrinello, Michele a

a ETH ZURICH (Switzerland)

b UNIVERSITY OF MILANO BICOCCA (Italy)

c RWTH AACHEN UNIVERSITY (Germany)

d IMPERIAL COLLEGE LONDON (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO SIMULATIONS; AMORPHOUS PHASE; AMORPHOUS PHASE-CHANGE MATERIAL; BOND POLARIZABILITY; EXPERIMENTAL DATA; LOCAL STRUCTURE; OCTAHEDRAL SITES; RAMAN SPECTRUM; SCATTERING GEOMETRIES; TETRAHEDRAL STRUCTURES; VIBRATIONAL MODES;

ATOMIC SPECTROSCOPY; ATOMS; GERMANIUM; PHASE CHANGE MATERIALS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; TELLURIUM COMPOUNDS;

AMORPHOUS MATERIALS;

EID: 77649152224 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.104.085503 Document Type: Article

Times cited : (177)

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