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Volumn 11, Issue 44, 2015, Pages 5932-5938

Integration of High-k Oxide on MoS2 by Using Ozone Pretreatment for High-Performance MoS2 Top-Gated Transistor with Thickness-Dependent Carrier Scattering Investigation

Author keywords

MoS2 transistors; scattering; thickness dependence; top gated, ozone pretreatments, transistors

Indexed keywords

DEPOSITION; HAFNIUM OXIDES; MOLYBDENUM COMPOUNDS; OZONE; SCATTERING; TRANSISTORS;

EID: 84954517763     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201501260     Document Type: Article
Times cited : (83)

References (37)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.