메뉴 건너뛰기




Volumn 5, Issue 10, 2011, Pages 7707-7712

Nature of electronic states in atomically thin MoS2 field-effect transistors

Author keywords

charge impurity scattering; dichalcogenides; field effect transistor; localization; MoS2; Mott variable range hopping; resonant tunneling

Indexed keywords

DICHALCOGENIDES; IMPURITY SCATTERING; LOCALIZATION; MOS2; MOTT VARIABLE-RANGE HOPPING;

EID: 80054983584     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn202852j     Document Type: Article
Times cited : (811)

References (22)
  • 5
    • 63849115163 scopus 로고    scopus 로고
    • Resistance Noise in Electrically Biased Bilayer Graphene
    • Pal, A. N.; Ghosh, A. Resistance Noise in Electrically Biased Bilayer Graphene Phys. Rev. Lett. 2011, 102, 126805
    • (2011) Phys. Rev. Lett. , vol.102 , pp. 126805
    • Pal, A.N.1    Ghosh, A.2
  • 7
    • 0000577103 scopus 로고
    • Maximum Low-Temperature Mobility of Two-Dimensional Electrons in Heterojunctions with a Thick Spacer Layer
    • Efros, A. L.; Pikus, F. G.; Samsonidze, G. G. Maximum Low-Temperature Mobility of Two-Dimensional Electrons in Heterojunctions with a Thick Spacer Layer Phys. Rev. B 1990, 41, 8295-8301
    • (1990) Phys. Rev. B , vol.41 , pp. 8295-8301
    • Efros, A.L.1    Pikus, F.G.2    Samsonidze, G.G.3
  • 8
    • 65849200089 scopus 로고    scopus 로고
    • Theory of Charged Impurity Scattering in Two-Dimensional Graphene
    • Adam, S.; Hwang, E. H.; Rossi, E.; Das Sarma, S. Theory of Charged Impurity Scattering in Two-Dimensional Graphene Solid State Commun. 2009, 149, 1072-1079
    • (2009) Solid State Commun. , vol.149 , pp. 1072-1079
    • Adam, S.1    Hwang, E.H.2    Rossi, E.3    Das Sarma, S.4
  • 9
    • 38849201768 scopus 로고    scopus 로고
    • Observaion of Electron-Hole Puddles in Graphene Using a Scanning Single-Electron Transistor
    • Martin, J.; Akerman, N.; Ulbricht, G.; Lohmann, T.; Smet, J. H.; Klitzing, K. v.; Yacoby, A. Observaion of Electron-Hole Puddles in Graphene Using a Scanning Single-Electron Transistor Nat. Phys. 2008, 4, 144-148
    • (2008) Nat. Phys. , vol.4 , pp. 144-148
    • Martin, J.1    Akerman, N.2    Ulbricht, G.3    Lohmann, T.4    Smet, J.H.5    Klitzing, K.V.6    Yacoby, A.7
  • 11
    • 33846295541 scopus 로고    scopus 로고
    • Realization and Electrical Characterization of Ultrathin Crystals of Layered Transition-Metal Dichalcogenides
    • Ayari, A.; Cobas, E.; Ogundadegbe, O.; Fuhrer, M. S. Realization and Electrical Characterization of Ultrathin Crystals of Layered Transition-Metal Dichalcogenides J. Appl. Phys. 2007, 101, 014507
    • (2007) J. Appl. Phys. , vol.101 , pp. 014507
    • Ayari, A.1    Cobas, E.2    Ogundadegbe, O.3    Fuhrer, M.S.4
  • 14
    • 0037011024 scopus 로고    scopus 로고
    • Variable range hopping as possible origin of a universal relation between conductivity and mobility in disordered organic semiconductors
    • DOI 10.1016/S0379-6779(02)00236-9, PII S0379677902002369
    • Paasch, G.; Lindner, T.; Scheinert, S. Variable Range Hopping as Possible Origin of a Universal Relation between Conductivity and Mobility in Disordered Organic Semiconductors Synth. Met. 2002, 132, 97-104 (Pubitemid 35420993)
    • (2002) Synthetic Metals , vol.132 , Issue.1 , pp. 97-104
    • Paasch, G.1    Lindner, T.2    Scheinert, S.3
  • 16
    • 0001415422 scopus 로고    scopus 로고
    • Screening of the Coulomb Interaction in Two-Dimensional Variable-Range Hopping
    • Van Keuls, F. W.; Hu, X. L.; Jiang, H. W.; Dahm, A. J. Screening of the Coulomb Interaction in Two-Dimensional Variable-Range Hopping Phys. Rev. B 1997, 56, 1161-1169
    • (1997) Phys. Rev. B , vol.56 , pp. 1161-1169
    • Van Keuls, F.W.1    Hu, X.L.2    Jiang, H.W.3    Dahm, A.J.4
  • 17
    • 0348239734 scopus 로고
    • The Spatial Extent of Localized State Wavefunctions in Silicon Inversion Layers
    • Pepper, M.; Pollitt, S.; Adkins, C. J. The Spatial Extent of Localized State Wavefunctions in Silicon Inversion Layers J. Phys. C: Solid State Phys. 1974, 7, L273-L277
    • (1974) J. Phys. C: Solid State Phys. , vol.7
    • Pepper, M.1    Pollitt, S.2    Adkins, C.J.3
  • 19
    • 0000200847 scopus 로고
    • Observation of Resonant Tunneling in Silicon Inversion Layers
    • Fowler, A. B.; Timp, G. L.; Wainer, J. J.; Webb, R. A. Observation of Resonant Tunneling in Silicon Inversion Layers Phys. Rev. Lett. 1986, 57, 138-141
    • (1986) Phys. Rev. Lett. , vol.57 , pp. 138-141
    • Fowler, A.B.1    Timp, G.L.2    Wainer, J.J.3    Webb, R.A.4
  • 20
    • 2942537992 scopus 로고    scopus 로고
    • Density-Dependent Instabilities in Correlated Two Dimensional Electron Systems
    • Ghosh, A.; Pepper, M.; Beere, E. B.; Ritchie, D. A. Density-Dependent Instabilities in Correlated Two Dimensional Electron Systems J. Phys. C: Condens. Matter 2004, 16, 3623-3631
    • (2004) J. Phys. C: Condens. Matter , vol.16 , pp. 3623-3631
    • Ghosh, A.1    Pepper, M.2    Beere, E.B.3    Ritchie, D.A.4
  • 21
    • 0024732795 scopus 로고
    • A 1/f Noise Technique to Extract the Oxide Trap Density near the Conduction Band Edge of Silicon
    • Jayaraman, R.; Sodini, C. G. A 1/f Noise Technique To Extract the Oxide Trap Density near the Conduction Band Edge of Silicon IEEE Trans. Electron Dev. 1989, 36, 1773
    • (1989) IEEE Trans. Electron Dev. , vol.36 , pp. 1773
    • Jayaraman, R.1    Sodini, C.G.2
  • 22
    • 41549145225 scopus 로고    scopus 로고
    • Boltzmann Transport and Residual Conductivity in Bilayer Graphene
    • Adam, S.; Das Sarma, S. Boltzmann Transport and Residual Conductivity in Bilayer Graphene Phys. Rev. B 2008, 77, 115436
    • (2008) Phys. Rev. B , vol.77 , pp. 115436
    • Adam, S.1    Das Sarma, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.