CdTe and CdZnTe Semiconductor Detectors for Nuclear Medicine Imaging

Emission Tomography: The Fundamentals of PET and SPECT

Volumn , Issue , 2004, Pages 269-291

  Wagenaar, Douglas J ^a  

^a SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84942808939     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-012744482-6.50018-1     Document Type: Chapter

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