Growth and properties of high resistivity Cd0.8Zn0.2Te single crystals

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors

Volumn 23, Issue 2, 2002, Pages 157-160

  Li, Qifeng ^a   Zhu, Shifu ^a   Zhao, Beijun ^a   Cai, Li ^a   Gao, Deyou ^a   Jin, Yingrong ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

Bridgeman method; Cd0.8Zn0.2Te; Crystal growth; Room nuclear radiation detector

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; RADIATION DETECTORS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING ZINC COMPOUNDS; X RAY DIFFRACTION;

BRIDGEMAN METHOD; CZT CRYSTAL; ROOM NUCLEAR RADIATION DETECTOR;

CRYSTAL GROWTH;

EID: 0036486009     PISSN: 02534177     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)