Effects of detector scatter on photopeak fraction in pixellated solid state detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 422, Issue 1-3, 1999, Pages 463-468

  Wagenaar, Douglas J ^a   Brooks, Donald J ^a   Kalinosky, Michael ^a   Engdahl, John C ^a  

^a SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

Application specific integrated circuits; NaI scintillators; Solid state detectors

Indexed keywords

EID: 4244135649     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01117-6     Document Type: Article

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