Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4141, Issue 1, 2000, Pages 324-335

  Wright, G W ^a,b   James, R B ^a   Chinn, D ^a   Brunett, B A ^a   Olsen, R W ^a   van Scyoc, J ^a   Clift, M ^a   Burger, A ^b   Chattopadhyay, K ^b   Shi, D ^b   Wingfield, R ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b FISK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DIELECTRIC MATERIALS; ELECTRODES; LEAKAGE CURRENTS; PASSIVATION; SEMICONDUCTING CADMIUM TELLURIDE; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

CADMIUM ZINC TELLURIDE DETECTORS;

RADIATION DETECTORS;

EID: 0001101784     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.407594     Document Type: Article

References (0)