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Volumn 428, Issue 1, 1999, Pages 8-13

Characterization of metal contacts on and surfaces of cadmium zinc telluride

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; DATABASE SYSTEMS; DEPOSITION; ELECTRIC CONTACTS; IMAGING TECHNIQUES; LEAKAGE CURRENTS; OXIDATION; PHOTOCONDUCTIVITY; SEMICONDUCTING CADMIUM COMPOUNDS; SPECTROSCOPY; SURFACE TREATMENT;

EID: 0032631491     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01574-5     Document Type: Article
Times cited : (36)

References (29)
  • 7
    • 0004005306 scopus 로고
    • The Physics of Semiconductor Devices
    • New York: Wiley
    • Sze S.M. The Physics of Semiconductor Devices. Second ed. 1981;Wiley, New York.
    • (1981) Second Ed.
    • Sze, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.