Advanced readout ASICs for multielement CZT detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4784, Issue , 2003, Pages 105-118

  De Geronimo, G ^a   O'Connor, P ^a   Kandasamy, A ^a   Grosholz, J ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b II VI Inc   (United States)

Author keywords

ASIC; CMOS; CZT; Derandomizer; Low noise; Peak detector; Preamplifier; Shaper

Indexed keywords

AMPLIFIERS (ELECTRONIC); APPLICATION SPECIFIC INTEGRATED CIRCUITS; CADMIUM ALLOYS; CMOS INTEGRATED CIRCUITS; GAMMA RAYS; II-VI SEMICONDUCTORS; INDUSTRIAL RESEARCH; LEAKAGE CURRENTS; SEMICONDUCTOR ALLOYS; SIGNAL PROCESSING; X RAYS; Z TRANSFORMS; ZINC ALLOYS;

BROOKHAVEN NATIONAL LABORATORY; DERANDOMIZER; DETECTOR LEAKAGE CURRENTS; DRIVING CAPABILITY; LOW NOISE; PEAK DETECTORS; PROGRAMMABLE GAIN; SHAPER;

X RAY DETECTORS;

EID: 77949385243     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.455775     Document Type: Conference Paper

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