Resistivity variation of semi-insulating Cd1-xZnxTe in relationship to alloy composition

Journal of Electronic Materials

Volumn 28, Issue 6, 1999, Pages 838-842

  Yoon, H ^a   Goorsky, M S ^a   Brunett, B A ^b   Van Scyoc, J M ^b   Lund, J C ^b   James, R B ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; COMPOSITION EFFECTS; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC CURRENT MEASUREMENT; LATTICE CONSTANTS; LEAKAGE CURRENTS; RADIATION DETECTORS; X RAY CRYSTALLOGRAPHY;

CADMIUM ZINC TELLURIDE; EFFECTIVE SEGREGATION COEFFICIENT; SEMICONDUCTOR DETECTORS;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0032629415     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-999-0080-4     Document Type: Article

References (14)

1. D.M. Hofmann, W. Stadler, P. Christmann and B.K. Meyer, Nucl. Instr. Meth. A 380, 117 (1996).
2. L. Chibani, M. Hage-Ali and P. Siffert, J. Cryst. Growth 161, 153 (1996).
3. Cs. Szeles, Y.Y. Shan, K.G. Lynn and E.E. Eissler, Nucl. Instr. Meth. A 380, 148 (1996).
4. Cs. Szeles, Y.Y. Shan, K.G. Lynn, A.R. Moodenbaugh and E.E. Eissler, Phys. Rev. B 55, 6945 (1997).
5. A. Castaldini, A. Cavallini, B. Fraboni, P. Fernandez and J. Piqueras, J. Appl. Phys. 83, 2121 (1998).
6. th Scientific Symp. on Room Temperature Semiconductor X-Ray, Gamma-Ray, and Neutron Detectors,'' Livermore, CA, June 10-11, 1998.
7. V. Swaminathan and A.T. Macrander, Materials Aspects of GaAs and InP Based Structures, (Englewood Cliffs, NJ: Prentice Hall, 1991), ch. 3.
8. J.F. Butler, F.P. Doty and C. Lingren, SPIE 1734, 131 (1992).
9. W. Shockley, Electrons and Holes in Semiconductors, (New York: Krieger, 1981), ch 16.
10. H. Yoon, S.E. Lindo and M.S. Goorsky, J. Cryst. Growth 174, 775 (1997).
11. H. Yoon, J.M. Van Scyoc, T.S. Gilbert, M.S. Goorsky, B.A. Brunett, J.C. Lund, H. Hermon, M. Schieber and R.B. James, Mater. Res. Soc. Symp. Proc. 487, (Warrendale, PA: Mater. Res. Soc., 1998), p. 115.
12. B.A. Brunett, J.M. Van Scyoc, H. Yoon, T.S. Gilbert, T.E. Schlesinger, J.C. Lund and R.B. James, Mater. Res. Soc. Symp. Proc. 487, (Warrendale, PA: Mater. Res. Soc., 1998), p. 39.
13. S.B. Zhang, S-H. Wei and A. Zunger, J. Appl. Phys. 83, 3192 (1998).
14. D.J. Olego, J.P. Faurie, S. Sivananthan and P.M. Raccah, Appl. Phys. Lett. 47, 1172 (1985).