Elementary analysis of line shapes and energy resolution in semiconductor radiation detectors

Materials Research Society Symposium - Proceedings

Volumn 487, Issue , 1998, Pages 193-198

  Toney, J E ^a   Schlesinger, T E ^a   Brunett, B A ^a   James, R B ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY GAP; GAMMA RAYS; LEAKAGE CURRENTS; PHOTOELECTRICITY; PHOTONS; SEMICONDUCTOR DEVICES; STATISTICAL METHODS; X RAYS;

SEMICONDUCTOR RADIATION DETECTORS;

RADIATION DETECTORS;

EID: 0031639339     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)