Spectroscopic response versus interelectrodic charge formation position in CdTe detectors

Materials Research Society Symposium - Proceedings

Volumn 487, Issue , 1998, Pages 309-314

  Auricchio, N ^a   Caroli, E ^a   De Cesare, G ^a   Dusi, W ^a   Grassi, D ^a   Hage Ali, M ^a   Perillo, E ^a   Siffert, P ^a   Spadaccini, G ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; CRYSTAL LATTICES; DEPOSITION; ELECTRODES; ELECTRON ENERGY LEVELS; OPTICAL COLLIMATORS; PHOTONS; SEMICONDUCTING CADMIUM COMPOUNDS; SPECTROSCOPIC ANALYSIS; TUNGSTEN;

CADMIUM TELLURIDE; HECHT RELATION; SEMICONDUCTOR DETECTORS;

RADIATION DETECTORS;

EID: 0031618147     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)