Charge loss between contacts of CdZnTe pixel detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 432, Issue 2-3, 1999, Pages 326-331

  Bolotnikov, A E ^a   Cook, W R ^a   Harrison, F A ^a   Wong, A S ^a   Schindler, S M ^a   Eichelberger, A C ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; ELECTRIC SPACE CHARGE; ELECTRONS; SEMICONDUCTING CADMIUM COMPOUNDS; SURFACES; X RAYS;

CHARGE LOSS; ELECTRIC FIELD DISTRIBUTION; PIXEL DETECTORS;

PARTICLE DETECTORS;

EID: 0344240890     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00388-5     Document Type: Article

References (6)

1. James R.B., Brunett B., Heffelfinger J. J. Electron. Mater. 27:1998;788.
2. R.H. Kingston, (Ed.), "Semiconductor Surface Physics", University of Pennsylvania Press, Philadelphia 1957.
3. Barrett H.H., Eskin J.D., Barber H.B. Phys. Rev. Lett. 75:1995;156.
4. Kurczynski P., Krizmanic J.F., Stahle C.M. IEEE Trans. Nucl. Sci. 44:1997;1011.
5. Bennett P.R., Shah K.S., Cirignano L.J. IEEE Trans. Nucl. Sci. 45:1998;417.
6. Florent J.J., Gaudaen J., Ropelewski L., Sauli F. Nucl. Instr. and Meth. A. 329:1993;125.