-
1
-
-
64149095601
-
Special section on advanced process control
-
Moyne, J. R., Patel, N. S., Special section on advanced process control, IEEE Transactions on Semiconductor Manufacturing, 20(4), 343-344, (2007)
-
(2007)
IEEE Transactions on Semiconductor Manufacturing
, vol.20
, Issue.4
, pp. 343-344
-
-
Moyne, J.R.1
Patel, N.S.2
-
2
-
-
84855921402
-
A survey of problems, solution techniques, and future challenges in scheduling semiconductor manufacturing operations
-
Mönch, L., Fowler, J. W., Dauzère-Pérès, S., Mason, S. J., Rose, O., A survey of problems, solution techniques, and future challenges in scheduling semiconductor manufacturing operations, Journal of Scheduling, 14(6), 583-599, (2011)
-
(2011)
Journal of Scheduling
, vol.14
, Issue.6
, pp. 583-599
-
-
Mönch, L.1
Fowler, J.W.2
Dauzère-Pérès, S.3
Mason, S.J.4
Rose, O.5
-
3
-
-
0000793139
-
Cramming more components onto integrated circuits
-
Moore, G. E., Cramming More Components onto Integrated Circuits, Electronics, 38(8), 114-117, (1965)
-
(1965)
Electronics
, vol.38
, Issue.8
, pp. 114-117
-
-
Moore, G.E.1
-
4
-
-
34547433202
-
Control relevant issues in semiconductor manufacturing: Overview with some new results
-
Su, A.-J., Jeng, J.-C., Huang, H.-P., Yu, C.-C., Hung, S.-Y., Chao, C.-K., Control relevant issues in semiconductor manufacturing: Overview with some new results, Control Engineering Practice, 15(10), 1268-1279, (2007)
-
(2007)
Control Engineering Practice
, vol.15
, Issue.10
, pp. 1268-1279
-
-
Su, A.-J.1
Jeng, J.-C.2
Huang, H.-P.3
Yu, C.-C.4
Hung, S.-Y.5
Chao, C.-K.6
-
5
-
-
0034325420
-
Automatic control in microelectronics manufacturing: Practices, challenges, and possibilities
-
Edgar, T. F., Butler, S. W., Campbell, W. J., Pfeiffer, C., Bode, C., Hwang, S. B., Balakrishnan, K. S., Hahn, J., Automatic Control in Microelectronics Manufacturing: Practices, Challenges, and Possibilities, Automatica, 36(11), (2000)
-
(2000)
Automatica
, vol.36
, Issue.11
-
-
Edgar, T.F.1
Butler, S.W.2
Campbell, W.J.3
Pfeiffer, C.4
Bode, C.5
Hwang, S.B.6
Balakrishnan, K.S.7
Hahn, J.8
-
7
-
-
0030387659
-
APC in the semiconductor industry, history and near term prognosis
-
Cambridge, (USA)
-
Barna, G. G., APC in the semiconductor industry, history and near term prognosis, In Proceedings of Advanced Semiconductor Manufacturing Conference and Workshop, Cambridge, (USA), 364-369, (1996)
-
(1996)
Proceedings of Advanced Semiconductor Manufacturing Conference and Workshop
, pp. 364-369
-
-
Barna, G.G.1
-
8
-
-
60749132196
-
Impact of qualification management on scheduling in semiconductor manufacturing
-
Miami, Florida (USA)
-
Johnzèn, C., Vialletelle, P., Dauzère-Pérès, S., Yugma, C., Der-reumaux, A., Impact of qualification management on scheduling in semiconductor manufacturing, In Proceedings of the Winter Simulation Conference (WSC), Miami, Florida (USA), 2059-2066, (2008)
-
(2008)
Proceedings of the Winter Simulation Conference (WSC)
, pp. 2059-2066
-
-
Johnzèn, C.1
Vialletelle, P.2
Dauzère-Pérès, S.3
Yugma, C.4
Der-Reumaux, A.5
-
9
-
-
50249171149
-
Dynamic, weight-based sampling algorithm
-
Santa Clara, California (USA)
-
Purdy, M., Dynamic, Weight-Based Sampling Algorithm, In Proceedings of the International Symposium on Semiconductor Manufacturing, Santa Clara, California (USA), 1-4, (2007)
-
(2007)
Proceedings of the International Symposium on Semiconductor Manufacturing
, pp. 1-4
-
-
Purdy, M.1
-
10
-
-
64149116786
-
An MILP approach to wafer sampling and selection
-
Good, P. R., Purdy, M. A., An MILP Approach to wafer sampling and selection, In IEEE Transactions on Semiconductor Manufacturing, 20(4), 400-407, (2007)
-
(2007)
IEEE Transactions on Semiconductor Manufacturing
, vol.20
, Issue.4
, pp. 400-407
-
-
Good, P.R.1
Purdy, M.A.2
-
11
-
-
84872504321
-
Sampling decision system in semiconductor manufacturing using virtual metrology
-
Seoul (Korea)
-
Kurz, D., Deluca, C., Pilz, J., Sampling decision system in semiconductor manufacturing using virtual metrology, In Proceedings of the 8th IEEE International Conference on Automation Science and Engineering (Case), Seoul (Korea), 74-79, (2012)
-
(2012)
Proceedings of the 8th IEEE International Conference on Automation Science and Engineering (Case)
, pp. 74-79
-
-
Kurz, D.1
Deluca, C.2
Pilz, J.3
-
12
-
-
45549093219
-
A fab-wide APC sampling application
-
Holfeld, A., Barlovic, R., Good, R. P., A Fab-Wide APC Sampling Application, IEEE Transactions on Semiconductor Manufacturing, 20(4), 393-399, (2007)
-
(2007)
IEEE Transactions on Semiconductor Manufacturing
, vol.20
, Issue.4
, pp. 393-399
-
-
Holfeld, A.1
Barlovic, R.2
Good, R.P.3
-
13
-
-
77957561785
-
A smart sampling algorithm to minimize risk dynamically
-
San Francisco, CA (USA)
-
Dauzère-Pérès, S., Rouveyrol, J.-L., Yugma, C., Vialletelle, P., A smart sampling algorithm to minimize risk dynamically, In Proceedings of the IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC), San Francisco, CA (USA), 1078-8743, (2010)
-
(2010)
Proceedings of the IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
, pp. 1078-8743
-
-
Dauzère-Pérès, S.1
Rouveyrol, J.-L.2
Yugma, C.3
Vialletelle, P.4
-
14
-
-
84861234351
-
Single-machine scheduling with advanced process control constraints
-
to appear
-
Cai, Y., Kutanoglu, E., Hasenbein, J., Qin, J., Single-machine scheduling with advanced process control constraints, Journal of Scheduling, to appear, DOI: 10.1007/s10951-010-0215-8
-
Journal of Scheduling
-
-
Cai, Y.1
Kutanoglu, E.2
Hasenbein, J.3
Qin, J.4
-
15
-
-
84939789764
-
Scheduling job families on parallel machines with a bi-criteria objective function under time constraints
-
Phoenix, Arizona, (USA)
-
Obeid, A., Dauzère-Pérès, S., Yugma, C., Scheduling Job Families on Parallel Machines with a Bi-Criteria Objective Function under Time Constraints, In Proceedings of the Multidisciplinary International Conference on Scheduling: Theory and Applications (MISTA), Phoenix, Arizona, (USA), 645-648, (2011)
-
(2011)
Proceedings of the Multidisciplinary International Conference on Scheduling: Theory and Applications (MISTA)
, pp. 645-648
-
-
Obeid, A.1
Dauzère-Pérès, S.2
Yugma, C.3
-
16
-
-
64149086678
-
An evaluation of the benefits of integrating run-to-run control with scheduling and dispatching systems
-
Anderson, M., Hanish, C. K., An Evaluation of the Benefits of Integrating Run-to-Run Control With Scheduling and Dispatching Systems, IEEE Transactions on Semiconductor Manufacturing, 20(4), 386-392, (2007)
-
(2007)
IEEE Transactions on Semiconductor Manufacturing
, vol.20
, Issue.4
, pp. 386-392
-
-
Anderson, M.1
Hanish, C.K.2
-
17
-
-
56349137609
-
Scheduling semiconductor manufacturing processes to enhance system identification
-
Pasadyn, A. J., Lee, H., Edgar, T. F., Scheduling semiconductor manufacturing processes to enhance system identification, Journal of Process Control, 18(10), 946-953, (2008)
-
(2008)
Journal of Process Control
, vol.18
, Issue.10
, pp. 946-953
-
-
Pasadyn, A.J.1
Lee, H.2
Edgar, T.F.3
-
18
-
-
0022682320
-
Problems associated with quality control sampling in modern IC manufacturing
-
Pesotchinsky, L., Problems Associated with Quality Control Sampling in Modern IC Manufacturing, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 10(1), 107-110, (1987)
-
(1987)
IEEE Transactions on Components, Hybrids, and Manufacturing Technology
, vol.10
, Issue.1
, pp. 107-110
-
-
Pesotchinsky, L.1
-
19
-
-
84858040456
-
A smart sampling scheduling and skipping simulator and its evaluation on real data sets
-
Phoenix, Arizona (USA)
-
Yugma, C., Dauzère-Pérès, S., Rouveyrol, J.-L., Vialletelle, P., Pinaton, J., Relliaud, C., A smart sampling scheduling and skipping simulator and its evaluation on real data sets, In Proceedings of the Winter Simulation Conference (WSC), Phoenix, Arizona (USA), 1903-1912, (2011)
-
(2011)
Proceedings of the Winter Simulation Conference (WSC)
, pp. 1903-1912
-
-
Yugma, C.1
Dauzère-Pérès, S.2
Rouveyrol, J.-L.3
Vialletelle, P.4
Pinaton, J.5
Relliaud, C.6
-
20
-
-
84872525920
-
Scheduling on parallel machines with time constraints and equipment health factors
-
Seoul, (Korea)
-
Obeid, A., Dauzère-Pérès, S., Yugma, C., Scheduling on parallel machines with time constraints and Equipment Health Factors, In Proceedings of the 8th IEEE International Conference on Automation Science and Engineering (CASE 2012), Seoul, (Korea) 401-406, (2012)
-
(2012)
Proceedings of the 8th IEEE International Conference on Automation Science and Engineering (CASE 2012)
, pp. 401-406
-
-
Obeid, A.1
Dauzère-Pérès, S.2
Yugma, C.3
-
21
-
-
84855912023
-
Scheduling jobs on parallel machines to minimize a regular step total cost function
-
Detienne, B., Dauzère-Pérès, S., C. Yugma, C., Scheduling Jobs on Parallel Machines to Minimize a Regular Step Total Cost Function, Journal of Scheduling, 14(6), 523-538, (2011)
-
(2011)
Journal of Scheduling
, vol.14
, Issue.6
, pp. 523-538
-
-
Detienne, B.1
Dauzère-Pérès, S.2
Yugma, C.C.3
-
22
-
-
80052258988
-
An exact approach for scheduling jobs with regular step cost functions on a single machine
-
Detienne, B., Dauzère-Pérès, S., Yugma, C., An exact approach for scheduling jobs with regular step cost functions on a single machine, Computers & Operations Research, 39(5), 1033-1043 (2012)
-
(2012)
Computers & Operations Research
, vol.39
, Issue.5
, pp. 1033-1043
-
-
Detienne, B.1
Dauzère-Pérès, S.2
Yugma, C.3
-
23
-
-
84939859949
-
Hierarchical monitor scheme for recipe-independent tool condition evaluation. One approach of EHF (Equipment Health Factor)
-
Grenoble, France
-
Gleispach, D., Blue, J., Roussy, A., Haselmann, M., Hierarchical monitor scheme for recipe-independent tool condition evaluation. One approach of EHF (Equipment Health Factor), In Proceedings of 12th European Advanced Process Control and Manufacturing Conference (APCM), Grenoble, France, (2012)
-
(2012)
Proceedings of 12th European Advanced Process Control and Manufacturing Conference (APCM)
-
-
Gleispach, D.1
Blue, J.2
Roussy, A.3
Haselmann, M.4
-
24
-
-
34250193663
-
Real-time health prognosis and dynamic preventive maintenance policy for equipment under aging Markovian deterioration
-
Chen, A., Wu, G. S., Real-time Health Prognosis and Dynamic Preventive Maintenance Policy for Equipment under Aging Markovian Deterioration, International Journal of Production Research, 45(15), 3351-3379, (2007)
-
(2007)
International Journal of Production Research
, vol.45
, Issue.15
, pp. 3351-3379
-
-
Chen, A.1
Wu, G.S.2
-
25
-
-
49149131851
-
Test wafer management and automated wafer sorting
-
Faruqi, A., Goss, R., Adhikari, D., Kowtsch, T., Test Wafer Management and Automated Wafer Sorting, In Proceedings of the IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 322-326, (2008)
-
(2008)
Proceedings of the IEEE/SEMI Advanced Semiconductor Manufacturing Conference
, pp. 322-326
-
-
Faruqi, A.1
Goss, R.2
Adhikari, D.3
Kowtsch, T.4
-
26
-
-
84873372405
-
Tool condition diagnosis with a recipe-independent hierarchical monitoring scheme
-
Blue, J., Gleispach, D., Roussy, A., Scheibelhofer, P., Tool Condition Diagnosis With a Recipe-Independent Hierarchical Monitoring Scheme, IEEE Transactions on Semiconductor Manufacturing, 26(1), 82-91, (2013)
-
(2013)
IEEE Transactions on Semiconductor Manufacturing
, vol.26
, Issue.1
, pp. 82-91
-
-
Blue, J.1
Gleispach, D.2
Roussy, A.3
Scheibelhofer, P.4
-
27
-
-
84877259415
-
A literature review on sampling techniques in semiconductor manufacturing
-
Nduhura-Munga, J., Rodriguez-Verjan, G., Dauzère-Pérès, S., Yugma, C., Vialletelle, P., Pinaton, J., A literature review on sampling techniques in semiconductor manufacturing, IEEE Transactions on Semiconductor Manufacturing, 26(2), 188-195, (2013)
-
(2013)
IEEE Transactions on Semiconductor Manufacturing
, vol.26
, Issue.2
, pp. 188-195
-
-
Nduhura-Munga, J.1
Rodriguez-Verjan, G.2
Dauzère-Pérès, S.3
Yugma, C.4
Vialletelle, P.5
Pinaton, J.6
-
28
-
-
84898032023
-
Virtual metrology modeling for CVD film thickness
-
Besnard, J., Gleispach, D., Gris, H., Ferreira, A., Roussy, A., Ker-naflen, C., Hayderer, G., Virtual Metrology Modeling for CVD Film Thickness, International Journal of Control Science and Engineering, 2(3), 26-33, (2012)
-
(2012)
International Journal of Control Science and Engineering
, vol.2
, Issue.3
, pp. 26-33
-
-
Besnard, J.1
Gleispach, D.2
Gris, H.3
Ferreira, A.4
Roussy, A.5
Ker-Naflen, C.6
Hayderer, G.7
-
29
-
-
84863456306
-
Real-time scheduling of single-arm cluster tools subject to residency time constraints and bounded activity time variation
-
Qiao, Y., N. Wu, M. Zhou, Real-Time Scheduling of Single-Arm Cluster Tools Subject to Residency Time Constraints and Bounded Activity Time Variation, IEEE Transactions on Automation Science and Engineering, 9(3), 564-577, (2012).
-
(2012)
IEEE Transactions on Automation Science and Engineering
, vol.9
, Issue.3
, pp. 564-577
-
-
Qiao, Y.1
Wu, N.2
Zhou, M.3
-
30
-
-
77957569092
-
A capacity-dependence dynamic sampling strategy
-
San Jose, California (USA)
-
Lee, S. B., Lee, T. Y., Liao, J., Chang, Y. C., A Capacity-Dependence Dynamic Sampling Strategy, In Proceedings of the IEEE International Symposium on Semiconductor Manufacturing, San Jose, California (USA), 312-314, (2003)
-
(2003)
Proceedings of the IEEE International Symposium on Semiconductor Manufacturing
, pp. 312-314
-
-
Lee, S.B.1
Lee, T.Y.2
Liao, J.3
Chang, Y.C.4
-
31
-
-
4944220727
-
Making the move to fab-wide APC
-
Su, Y. C., Lin, T. H., Cheng, F. T., Wu, W. M., Making the move to fab-wide APC, Solide State Technology, 47(9), 426-434, (2004)
-
(2004)
Solide State Technology
, vol.47
, Issue.9
, pp. 426-434
-
-
Su, Y.C.1
Lin, T.H.2
Cheng, F.T.3
Wu, W.M.4
-
32
-
-
84939859950
-
-
John Wiley & Sons, Hoboken, New Jersey, chapter 6, chapter 9 333-378
-
May, G. S., Spanos, C. J., Fundamentals of Semiconductor Manufacturing and Process Control. John Wiley & Sons, Hoboken, New Jersey, chapter 6, chapter 9, 181-227, 333-378, (2006)
-
(2006)
Fundamentals of Semiconductor Manufacturing and Process Control.
, pp. 181-227
-
-
May, G.S.1
Spanos, C.J.2
-
33
-
-
0003572833
-
-
John Wiley & Sons, Hoboken, New Jersey, chapter 9
-
Montgomery, D. C., Introduction to Statistical Quality Control, John Wiley & Sons, Hoboken, New Jersey, chapter 9, 399-432, (2009)
-
(2009)
Introduction to Statistical Quality Control
, pp. 399-432
-
-
Montgomery, D.C.1
-
34
-
-
0024055865
-
Scheduling semiconductor wafer fabrication
-
Wein, L.M., Scheduling Semiconductor Wafer Fabrication, IEEE Transactions on Semiconductor Manufacturing, 1(3), 115-130, (1988)
-
(1988)
IEEE Transactions on Semiconductor Manufacturing
, vol.1
, Issue.3
, pp. 115-130
-
-
Wein, L.M.1
-
35
-
-
0033333765
-
Optimized sample planning for wafer detect inspection
-
Santa Clara, California (USA)
-
Williams, R., Gudmundsson, D., Monahan, K., Shanthikumar, J. G., Optimized sample planning for wafer detect inspection, In Proceedings of the IEEE International Symposium on Semiconductor Manufacturing Conference, Santa Clara, California (USA), 43-46, (1999)
-
(1999)
Proceedings of the IEEE International Symposium on Semiconductor Manufacturing Conference
, pp. 43-46
-
-
Williams, R.1
Gudmundsson, D.2
Monahan, K.3
Shanthikumar, J.G.4
-
36
-
-
84858390246
-
Global and local virtual metrology models for a plasma etch process
-
Lynn, S. A., Ringwood, J., MacGearailt N., Global and Local Virtual Metrology Models for a Plasma Etch Process, IEEE Transactions on Semiconductor Manufacturing, 25(1), 94-103, (2012)
-
(2012)
IEEE Transactions on Semiconductor Manufacturing
, vol.25
, Issue.1
, pp. 94-103
-
-
Lynn, S.A.1
Ringwood, J.2
MacGearailt, N.3
-
37
-
-
84876122279
-
Adaptive dispatching rule for semiconductor wafer fabrication facility
-
L. Li, Z. Sun, M. Zhou, F. Qiao, Adaptive Dispatching Rule for Semiconductor Wafer Fabrication Facility, IEEE Transactions on Automation Science and Engineering, 10(2), 354-364, (2013)
-
(2013)
IEEE Transactions on Automation Science and Engineering
, vol.10
, Issue.2
, pp. 354-364
-
-
Li, L.1
Sun, Z.2
Zhou, M.3
Qiao, F.4
-
38
-
-
38949143586
-
Dual-phase virtual metrology scheme
-
Cheng, F.-T., Huang, H.-C., Kao, C.-A., Dual-Phase Virtual Metrology Scheme, IEEE Transactions on Semiconductor Manufacturing, 20(4), 566-571, (2007)
-
(2007)
IEEE Transactions on Semiconductor Manufacturing
, vol.20
, Issue.4
, pp. 566-571
-
-
Cheng, F.-T.1
Huang, H.-C.2
Kao, C.-A.3
-
39
-
-
38949180899
-
Development of a generic virtual metrology framework
-
Scottsdale, Arizona, (USA)
-
Huang, H.-C., Su, Y.-C., Cheng, F.-T., Jian, J.-M., Development of a Generic Virtual Metrology Framework, In Proceedings of IEEE International Conference on Automation Science and Engineering (CASE), Scottsdale, Arizona, (USA), 282-287, (2007)
-
(2007)
Proceedings of IEEE International Conference on Automation Science and Engineering (CASE)
, pp. 282-287
-
-
Huang, H.-C.1
Su, Y.-C.2
Cheng, F.-T.3
Jian, J.-M.4
-
40
-
-
84855340878
-
Developing an automatic virtual metrology system
-
Cheng, F.-T., Huang, H.-C., Kao, C.-A., Developing an Automatic Virtual Metrology System, IEEE Transactions on Automation Science and Engineering, 9(1), 181-188, (2012)
-
(2012)
IEEE Transactions on Automation Science and Engineering
, vol.9
, Issue.1
, pp. 181-188
-
-
Cheng, F.-T.1
Huang, H.-C.2
Kao, C.-A.3
-
41
-
-
78650620592
-
Flexibility measures for qualification management in wafer fabs
-
Johnzèn, C., Dauzère-Pérès, S., Vialletelle, P., Flexibility measures for qualification management in wafer fabs, Production Planning and Control, 22(1), 81-90, (2011)
-
(2011)
Production Planning and Control
, vol.22
, Issue.1
, pp. 81-90
-
-
Johnzèn, C.1
Dauzère-Pérès, S.2
Vialletelle, P.3
-
42
-
-
27644445636
-
Adaptive sampling methodology for inline defect inspection
-
Munich (Germany)
-
Boussetta, A., Cross, A., Adaptive sampling methodology for inline defect inspection, In Proceedings of the IEEE/SEMI Advanced Semiconductor Manufacturing Conference, Munich (Germany), 25-31, (2005)
-
(2005)
Proceedings of the IEEE/SEMI Advanced Semiconductor Manufacturing Conference
, pp. 25-31
-
-
Boussetta, A.1
Cross, A.2
-
43
-
-
50249131916
-
Perspectives on integrated metrology and wafer-level control
-
Santa Clara, California (USA)
-
Lensing, K., Stirton, B., Perspectives on integrated metrology and wafer-level control, In Proceedings of the International Symposium on Semiconductor Manufacturing, Santa Clara, California (USA), 1-4, (2007)
-
(2007)
Proceedings of the International Symposium on Semiconductor Manufacturing
, pp. 1-4
-
-
Lensing, K.1
Stirton, B.2
-
44
-
-
84859753478
-
Modeling analysis and control of dual-arm cluster tools with residency time constraint and activity time variation based on petri nets
-
Wu, N., M. Zhou, Modeling, Analysis and Control of Dual-Arm Cluster Tools with Residency Time Constraint and Activity Time Variation based on Petri Nets, IEEE Transactions on Automation Science and Engineering, 9(2), 446-454, (2012).
-
(2012)
IEEE Transactions on Automation Science and Engineering
, vol.9
, Issue.2
, pp. 446-454
-
-
Wu, N.1
Zhou, M.2
|