Dynamic, weight-based sampling algorithm

IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

Volumn , Issue , 2007, Pages 211-214

  Purdy, Matthew ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; LEARNING ALGORITHMS; SEMICONDUCTOR MATERIALS;

INTERNATIONAL SYMPOSIUM; SAMPLING ALGORITHMS; SEMICONDUCTOR MANUFACTURING;

SAMPLING;

EID: 50249171149     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSM.2007.4446804     Document Type: Conference Paper

References (0)