An MILP approach to wafer sampling and selection

IEEE Transactions on Semiconductor Manufacturing

Volumn 20, Issue 4, 2007, Pages 400-407

  Good, Richard P ^a   Purdy, Matthew A ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE FREQUENCIES; MIXED-INTEGER LINEAR PROGRAMS; NOVEL ALGORITHMS; RULE VIOLATIONS; SELECTION CRITERION; SELECTION RULES; WAFER SAMPLINGS;

INTEGER PROGRAMMING;

EID: 64149116786     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2007.907616     Document Type: Article

References (9)

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