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Volumn 252, Issue 3, 2015, Pages 451-468

Scanning probe microscopy and spectroscopy of graphene on metals

Author keywords

Atomic force microscopy; Density functional theory; Graphene, metal surfaces; Scanning tunneling microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY FUNCTIONAL THEORY; ELECTRONIC PROPERTIES; GRAPHENE NANORIBBON; HYDROPHOBICITY; METALS; NANOCRYSTALS; NANORIBBONS; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; SILICON ON INSULATOR TECHNOLOGY;

EID: 84924202557     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.201451466     Document Type: Article
Times cited : (22)

References (166)
  • 5
    • 67649225738 scopus 로고    scopus 로고
    • A. Geim, Science 324, 1530 (2009).
    • (2009) Science , vol.324 , pp. 1530
    • Geim, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.