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Physical Review Letters

Volumn 102, Issue 17, 2009, Pages

Efficient first-principles simulation of noncontact atomic force microscopy for structural analysis

(4) Chan, T L a,b Wang, C Z b Ho, K M b Chelikowsky, James R a

a UNIVERSITY OF TEXAS AT AUSTIN (United States)

b IOWA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXPLICIT MODELING; FIRST-PRINCIPLES; FIRST-PRINCIPLES SIMULATIONS; NONCONTACT ATOMIC FORCE MICROSCOPY; SEMI-CONDUCTOR SURFACES; SI (1 1 1); STRUCTURAL MODELS; THEORETICAL STUDY; TIO2(110);

ATOMIC FORCE MICROSCOPY; ATOMS; MODEL STRUCTURES; RECONSTRUCTION (STRUCTURAL); SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SOLID STATE PHYSICS; STRUCTURAL ANALYSIS;

CRYSTAL ATOMIC STRUCTURE;

EID: 65549083782 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.102.176101 Document Type: Article

Times cited : (21)

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