An exchange intercalation mechanism for the formation of a two-dimensional Si structure underneath graphene

Nano Research

Volumn 5, Issue 5, 2012, Pages 352-360

  Cui, Yi ^a   Gao, Junfeng ^b   Jin, Li ^a   Zhao, Jijun ^b   Tan, Dali ^a   Fu, Qiang ^a   Bao, Xinhe ^a  

^a DALIAN INSTITUTE OF CHEMICAL PHYSICS   (China)

^b DALIAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Graphene; intercalation; low energy electron microscopy (LEEM); photoemission electron microscopy (PEEM); Ru(0001); silicon

Indexed keywords

EID: 84860913238     PISSN: 19980124     EISSN: 19980000     Source Type: Journal    
DOI: 10.1007/s12274-012-0215-4     Document Type: Article

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