Graphene on Rh(111): Scanning tunneling and atomic force microscopies studies

Applied Physics Letters

Volumn 100, Issue 24, 2012, Pages

  Voloshina, E N ^a   Dedkov, Yu S ^b   Torbrugge S ^b   Thissen, A ^b   Fonin, M ^c  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b SPECS SURFACE NANO ANALYSIS GMBH   (Germany)

^c UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM IMAGE; AFM TIP; APPLIED BIAS VOLTAGE; CHEMICAL CONTRAST; CRYSTALLOGRAPHIC STRUCTURE; DENSITY-FUNCTIONAL THEORY CALCULATIONS; FREQUENCY SHIFT; SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY;

GRAPHENE; RHODIUM;

ATOMIC FORCE MICROSCOPY;

EID: 84863327692     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4729549     Document Type: Article

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