Topographic and spectroscopic characterization of electronic edge States in CVD grown graphene nanoribbons

Nano Letters

Volumn 12, Issue 4, 2012, Pages 1928-1933

  Pan, Minghu ^a   Girão, E Costa ^e,f,g,h   Jia, Xiaoting ^b   Bhaviripudi, Sreekar ^b   Li, Qing ^a   Kong, Jing ^c   Meunier, V ^e,f,h   Dresselhaus, Mildred S ^c,d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c USA   (United States)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^e Research Rensselaer Polytechnic Institute   (United States)

^f RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^g FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

^h FEDERAL UNIVERSITY OF PIAUÍ   (Brazil)

Author keywords

chemical vapor deposition; edge states; Graphene; nanoribbon; scanning tunneling microscopy spectroscopy

Indexed keywords

AS-GROWN; ATOMIC RESOLUTION IMAGES; COULOMB REPULSIONS; EDGE DEFECTS; EDGE SHAPE; EDGE STATE; EDGE STRUCTURES; GRAPHENE NANORIBBONS; HIGH RESOLUTION; NANORIBBON STRUCTURES; NANORIBBONS; SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY; SPECTROSCOPIC CHARACTERIZATION; STM IMAGES; STRUCTURAL MODELS; THEORETICAL CALCULATIONS;

ELECTRONIC STRUCTURE; GRAPHENE; MODEL STRUCTURES; NANOSTRUCTURES; SCANNING TUNNELING MICROSCOPY; VAPORS;

CHEMICAL VAPOR DEPOSITION;

EID: 84859732722     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl204392s     Document Type: Article

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