In situ TEM nanomechanics

MRS Bulletin

Volumn 40, Issue 1, 2015, Pages 62-68

  Yu, Q ^a   Legros, M ^b   Minor, A M ^c  

^a ZHEJIANG UNIVERSITY   (China)

^b CNRS   (France)

^c University of California Berkeley   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; GRAIN BOUNDARIES; IN SITU PROCESSING; INSTRUMENT TESTING; MECHANICAL PROPERTIES; MECHANICAL TESTING; METALLURGY; TRANSMISSION ELECTRON MICROSCOPY;

DEFORMATION MECHANISM; DYNAMIC BEHAVIORS; IN SITU TRANSMISSION ELECTRON MICROSCOPY (TEM); MEASUREMENTS OF; METALS AND ALLOYS; NANOMECHANICAL TESTING; RECENT PROGRESS; TECHNICAL DEVELOPMENT;

NANOCRYSTALLINE ALLOYS;

EID: 84921414087     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs.2014.306     Document Type: Review

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