A Multi-step method for In situ mechanical characterization of 1-D nanostructures using a novel micromechanical device

Experimental Mechanics

Volumn 50, Issue 1, 2010, Pages 47-54

  Lu, Y ^a   Ganesan, Y ^a   Lou, J ^a  

^a Rice University   (United States)

Author keywords

1D nanostructure; FEA; In situ Nanoindenter; Micromechanical device

Indexed keywords

1D NANOSTRUCTURES; COMPRESSIVE FORCES; DISPLACEMENT CURVE; FINITE ELEMENT ANALYSIS; FORCE CONVERSION; HIGH RESOLUTION; IN-SITU; LOW YOUNG'S MODULUS; MECHANICAL CHARACTERIZATIONS; MICROMECHANICAL DEVICE; MULTI STEP METHODS; NANOINDENTERS; ONE-DIMENSIONAL NANOSTRUCTURE; SCANNING ELECTRON MICROSCOPE; TENSILE LOADING; TESTING SAMPLES; TRANSMISSION ELECTRON MICROSCOPE; YOUNG'S MODULUS;

ELASTIC MODULI; ELASTICITY; ELECTRON MICROSCOPES; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

FINITE ELEMENT METHOD;

EID: 77949321050     PISSN: 00144851     EISSN: 17412765     Source Type: Journal    
DOI: 10.1007/s11340-009-9222-0     Document Type: Article

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