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Applied Physics Letters

Volumn 98, Issue 5, 2011, Pages

A versatile microelectromechanical system for nanomechanical testing

(5) Pant, B a Allen, B L a Zhu, T a Gall, K a Pierron, O N a

a GEORGIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY AND PRECISION; CRITICAL PROPERTIES; ELECTRONIC MEASUREMENTS; EX SITU; IN-SITU; MAGNIFICATION IMAGES; MATERIAL TESTING; MEMSDEVICES; MICRO ELECTRO MECHANICAL SYSTEM; MICROELECTROMECHANICAL SYSTEMS; MODE OF OPERATIONS; NANO-CRYSTALLINE NICKEL; NANO-MATERIALS; NANOMECHANICAL TESTING; NANOMECHANICAL TESTS; UNIAXIAL TENSILE TEST;

MECHATRONICS; MEMS; MICROELECTROMECHANICAL DEVICES; NANOSYSTEMS; TENSILE TESTING;

COMPOSITE MICROMECHANICS;

EID: 79951478228 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3553195 Document Type: Article

Times cited : (36)

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