In situ TEM nanoindentation and deformation of Si-nanoparticle clusters

Journal of Physics D: Applied Physics

Volumn 42, Issue 3, 2009, Pages

  Lockwood, A J ^a   Inkson, B J ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AXIAL STIFFNESS; IN-SITU TEM; IN-SITU TRANSMISSIONS; INDENTER; MECHANICAL BEHAVIOURS; NANOPARTICLE CLUSTERS; ORIENTATION CHANGES; REAL-TIME IMAGING; SI NANOPARTICLES; WEAK INTERFACES;

DEFORMATION; IN SITU PROCESSING; NANOINDENTATION; SILICON; TRANSMISSION ELECTRON MICROSCOPY; VICKERS HARDNESS TESTING;

NANOPARTICLES;

EID: 63749113457     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/3/035410     Document Type: Article

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