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Volumn 42, Issue 4, 1998, Pages 248-254

An in situ nanoindentation specimen holder for a high voltage transmission electron microscope

Author keywords

Cross section; In situ TEM; Nanoindentation

Indexed keywords

MICROSTRUCTURE; POSITION CONTROL;

EID: 0032529105     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19980915)42:4<248::AID-JEMT3>3.0.CO;2-M     Document Type: Article
Times cited : (62)

References (9)
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  • 4
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    • (1992) J. Mat. Res. , vol.7 , pp. 1564-1583
    • Oliver, W.C.1    Pharr, G.M.2
  • 7
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    • The deformation and behavior of ceramic crystals subjected to very low load (nano)indentations
    • Page, T.F., Oliver, W.C., and McHargue, C.J. (1992) The deformation and behavior of ceramic crystals subjected to very low load (nano)indentations. J. Mat. Res., 7:450-473.
    • (1992) J. Mat. Res. , vol.7 , pp. 450-473
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  • 8
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    • Kansas City, MO
    • Wall, M.A., and Dahmen, U. (1995) Techniques for in-situ mechanical deformation of nanostructured materials. In: Proc. Micros. Soc.Am., Kansas City, MO, pp. 240-241.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.