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Volumn 26, Issue 46, 2014, Pages 7786-7806

Synchrotron soft X-ray absorption spectroscopy study of carbon and silicon nanostructures for energy applications

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; ENERGY CONVERSION; GRAPHENE; NANOSCIENCE; NANOSTRUCTURED MATERIALS; NANOWIRES; SEMICONDUCTOR QUANTUM DOTS; SOLAR CELLS; SURFACE CHEMISTRY; X RAY ABSORPTION SPECTROSCOPY; YARN;

EID: 84915818505     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201304507     Document Type: Review
Times cited : (88)

References (187)
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    • Springer, Heidelberg, Germany
    • J. Stöhr, NEXAFS Spectroscopy, Springer, Heidelberg, Germany 1992, p. 25.
    • (1992) NEXAFS Spectroscopy , pp. 25
    • Stöhr, J.1
  • 79
    • 84915790828 scopus 로고    scopus 로고
    • aXis2000 is written in interactive data language (IDL). It is available free for noncommercial use from, accessed: August 2014.
    • aXis2000 is written in interactive data language (IDL). It is available free for noncommercial use from http: //unicorn.mcmaster. ca/aXis2000.html, accessed: August 2014.
  • 100
    • 67649225738 scopus 로고    scopus 로고
    • A. K. Geim, Science 2009, 324, 1530.
    • (2009) Science , vol.324 , pp. 1530
    • Geim, A.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.