Simultaneous reduction and N-doping of graphene oxides by low-energy N 2+ ion sputtering

Carbon

Volumn 62, Issue , 2013, Pages 365-373

  Zhang, Liang ^a   Ye, Yifan ^a   Cheng, Dingling ^a   Zhang, Wenhua ^a   Pan, Haibin ^a   Zhu, Junfa ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CATALYST-FREE METHOD; GRAPHENE OXIDES; ION SPUTTERING; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURES; REDUCED GRAPHENE OXIDES; REDUCTION LEVEL; SIMULTANEOUS REDUCTION; XPS ANALYSIS;

GRAPHENE; PHOTOELECTRONS; X RAY PHOTOELECTRON SPECTROSCOPY;

SPUTTERING;

EID: 84880306630     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2013.06.018     Document Type: Article

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