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Volumn 4, Issue 8, 2010, Pages 4431-4436

Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy

Author keywords

Carbon nanotube; Irradiation; NEXAFS; X ray spectromicroscopy

Indexed keywords

ANISOTROPIC NANOSTRUCTURES; CHARACTERIZATION TECHNIQUES; HIGH SPATIAL RESOLUTION; ION DOSE; KILOELECTRONVOLT; LINEAR DICHROISM; NANO-DEVICES; NANOTUBE DIAMETERS; NEXAFS; POLARIZATION DEPENDENCE; SPECIFIC LOCATION; STRUCTURAL DEFECT; X RAY MICROSCOPY; X-RAY SPECTROMICROSCOPY;

EID: 78650154871     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn1002248     Document Type: Article
Times cited : (36)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.