Metallic and semiconducting single-walled carbon nanotubes: Differentiating individual SWCNTs by their carbon 1s spectra

ACS Nano

Volumn 6, Issue 12, 2012, Pages 10965-10972

  Rossouw, David ^a   Botton, Gianluigi A ^a,b   Najafi, Ebrahim ^a,b   Lee, Vincent ^a,b   Hitchcock, Adam P ^a,b  

^a MCMASTER UNIVERSITY   (Canada)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

chiral single walled carbon nanotubes; EELS; metallic; near edge X ray absorption spectroscopy; scanning transmission X ray microscopy; semiconducting; TEM

Indexed keywords

ABERRATION-CORRECTED; CHIRAL VECTORS; FINE STRUCTURES; HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; HIGH-PURITY; INNER SHELL EXCITATION SPECTRA; LINE SHAPE; METALLIC; NEAR EDGE X-RAY ABSORPTION SPECTROSCOPIES; SCANNING TRANSMISSION X RAY MICROSCOPY; SEMICONDUCTING; SPECTRAL DIFFERENCES; TRANSMISSION ELECTRON MICROSCOPE; UNOCCUPIED STATE; VAN HOVE SINGULARITIES; X-RAY ABSORPTION SPECTRUM; X-RAY LINEAR DICHROISMS;

ELECTROMAGNETIC WAVE ABSORPTION; SINGLE-WALLED CARBON NANOTUBES (SWCN); TRANSMISSION ELECTRON MICROSCOPY; X RAY ABSORPTION SPECTROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

CARBON NANOTUBE; METAL;

ARTICLE; CHEMISTRY; ELECTRON; SEMICONDUCTOR; SPECTROSCOPY;

ELECTRONS; METALS; NANOTUBES, CARBON; SEMICONDUCTORS; SPECTRUM ANALYSIS;

EID: 84871540799     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn3045227     Document Type: Article

References (38)

1. Baughman, R. H.; Zakhidov, A. A.; de Heer, W. A. Carbon Nanotubes-the Route Toward Applications Science 2002, 297, 787-792
2. Zheng, M.; Semke, D. Enrichment of Single Chirality Carbon Nanotubes J. Am. Chem. Soc. 2007, 129, 6084-6085
3. Krupke, R.; Hennrich, F.; von Lohneysen, H.; Kappes, M. M. Separation of Metallic from Semiconducting Single-Walled Carbon Nanotubes Science 2003, 301, 344-347
4. Arnold, M. S.; Green, A. A.; Hulvat, J. F.; Stupp, S. I.; Hersam, M. C. Sorting Carbon Nanotubes by Electronic Structure Using Density Differentiation Nat. Nanotechnol. 2006, 1, 60-65
5. Miyata, Y.; Yanagi, K.; Maniwa, Y.; Kataura, H. Optical Evaluation of the Metal-to-Semiconductor Ratio of Single-Wall Carbon Nanotubes J. Phys. Chem. C 2008, 112, 13187-13191
6. Hersam, M. C. Progress Towards Monodisperse Single-Walled Carbon Nanotubes Nat. Nanotechnol. 2008, 3, 387-394
7. Kim, W. J.; Usrey, M. L.; Strano, M. S. Selective Functionalization and Free Solution Electrophoresis of Single-Walled Carbon Nanotubes: Separate Enrichment of Metallic and Semiconducting SWNT Chem. Mater. 2007, 19, 1571-1576
8. Berciaud, S.; Cognet, L.; Poulin, P.; Weisman, R. B.; Lounis, B. Absorption Spectroscopy of Individual Single-Walled Carbon Nanotubes Nano Lett. 2007, 7, 1203-1207
9. O'Connell, M. J. Carbon Nanotubes: Properties and Applications; CRC Press: Boca Raton, FL, 2006.
10. Jorio, A.; Dresselhaus, M.; Dresselhaus, G. Carbon Nanotubes: Advanced Topics in the Synthesis, Structure, Properties and Applications; Springer-Verlag: Heidelberg, Germany, 2008.
11. Guldi, D. M.; Martin, N. Carbon Nanotubes and Related Structures; Wiley-VCH: Weinheim, Germany, 2010.
12. Egerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope, 3 rd ed.; Springer: Berlin, Germany, 2011.
13. Stöhr, J. NEXAFS Spectroscopy; Springer-Verlag: Berlin, 1992.
14. Ade, H.; Hitchcock, A. P. NEXAFS Microscopy and Resonant Scattering: Composition And Orientation Probed in Real and Reciprocal Space Polymer 2008, 49, 643-675
15. Hitchcock, A. P. In Handbook on Nanoscopy; Van Tendeloo, G.; Van Dyck, D.; Pennycook, S. J., Eds.; Wiley: New York, 2012;, Vol. II, Chapter 22, Soft X-ray Imaging and Spectromicroscopy, pp 745-791.
16. Kramberger, C.; Rauf, H.; Shiozawa, H.; Knupfer, M.; Büchner, B.; Pichler, T. Unraveling Van Hove Singularities in X-Ray Absorption Response of Single-Wall Carbon Nanotubes Phys. Rev. B 2007, 75, 235437-(1-4)
17. Ayala, P.; Miyata, Y.; De Blauwe, K.; Shiozawa, H.; Feng, Y.; Yanagi, K.; Kramberger, C.; Silva, S. R. P.; Follath, R.; Kataura, T. Disentanglement of the Electronic Properties of Metallicity-Selected Single-Walled Carbon Nanotubes Phys. Rev. B 2009, 80, 205427-(1-6)
18. Ayala, P.; Shiozawa, H.; De Blauwe, K.; Miyata, Y.; Follath, R.; Kataura, H.; Pichler, T. An X-Ray Absorption Approach to Mixed and Metallicity-Sorted Single-Walled Carbon Nanotubes J. Mater. Sci. 2010, 45, 5318-5322
19. De Blauwe, K.; Mowbray, D. J.; Miyata, Y.; Ayala, P.; Shiozawa, H.; Rubio, A.; Hoffmann, P.; Kataura, H.; Pichler, T. Combined Experimental and Ab Initio Study of the Electronic Structure of Narrow-Diameter Single-Wall Carbon Nanotubes with Predominant (6,4),(6,5) Chirality Phys. Rev. B 2010, 82, 125444
20. Mowbray, D. J.; Ayala, P.; Pichler, T.; Rubio, A. Computing C1s X-ray Absorption for Single-Walled Carbon Nanotubes with Distinct Electronic Type Mater. Express 2011, 1, 225-230
21. Gao, B.; Wu, Z.; Ågren, H.; Luo, Y. Chirality and Diameter Dependent X-Ray Absorption of Single Walled Carbon Nanotubes J. Chem. Phys. 2009, 131, 034704-(1-7)
22. Najafi, E.; Hitchcock, A. P.; Rossouw, D.; Botton, G. Mapping Defects in a Carbon Nanotube by Momentum Transfer Dependent Electron Energy Loss Spectromicroscopy Ultramicroscopy 2012, 113, 158-164
23. Najafi, E.; Hernández Cruz, D.; Obst, M.; Hitchcock, A. P.; Douhard, B.; Pireaux, J. J.; Felten, A. Polarization Dependence of Tthe C 1s X-Ray Absorption Spectra of Individual Multi-Walled Carbon Nanotubes Small 2008, 4, 2279-2285
24. Felten, A.; Gillon, X.; Gulas, M.; Pireaux, J. J.; Ke, X.; Van Tendeloo, G.; Bittencourt, C.; Kilcoyne, A. L. D.; Najafi, E.; Hitchcock, A. P. Measuring Point Defect Density in Individual Carbon Nanotubes Using Polarization-Dependent X-ray Microscopy ACS Nano 2010, 4, 4431-4436
25. Najafi, E.; Wang, J.; Hitchcock, A. P.; Guan, J.; Dénommée, S.; Simard, B. Characterization of Single-Walled Carbon Nanotubes by Scanning Transmission X-ray Spectromicroscopy: Purification, Order and Dodecyl Functionalization J. Am. Chem. Soc. 2010, 132, 9020-9029
26. Gao, M.; Zuo, M.; Twesten, R. D.; Petrov, I.; Nagahara, L. A.; Zhang, R. Structure Determination of Individual Single-Wall Carbon Nanotubes by Nanoarea Electron Diffraction Appl. Phys. Lett. 2003, 82, 2703-2705
27. Qin, L.-C. Electron Diffraction from Carbon Nanotubes Rep. Prog. Phys. 2006, 69, 2761-2821
28. Henke, B. L.; Gullikson, E. M.; Davis, J. C. X-ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E=50-30000 eV, Z=1-92. At. Data Nucl. Data Tables 1993, 54, 181-342 (updated version: http://henke.lbl.gov/optical-constants/).
29. Hitchcock, A. P.; Ishii, I. Carbon K-Shell Excitation Spectra of Linear and Branched Alkanes J. Electron Spectrosc. Relat. Phenom. 1987, 42, 11-26
30. Botton, G. A.; Burnell, G.; Humphreys, C. J.; Yadav, T.; Withers, J. C. Microstructural and Electron Spectroscopic Characterization of Carbon Nanostructures and Nanotubes Produced Using Multimetal Catalysts J. Phys. Chem. Solids 1997, 58, 1091-1102
31. Stéphan, O.; Kociak, M.; Henrard, L.; Suenaga, K.; Gloter, A.; Tencé, M.; Sandré, E.; Colliex, C. Electron Energy-Loss Spectroscopy on Individual Nanotubes J. Electron Spectrosc. Relat. Phenom. 2001, 114-116, 209-217
32. Prince, K. C.; Vondráček, M.; Karvonen, J.; Coreno, M.; Camilloni, R.; Avaldi, L.; de Simone, M. A Critical Comparison of Selected 1s and 2p Core Hole Widths J. Electron Spectrosc. Relat. Phenom. 1999, 101-103, 141-147
33. Moonoosawmy, K.; Kruse, P. To Dope or Not to Dope: The Effect of Sonicating Single-Wall Carbon Nanotubes in Common Lab Solvents on Their Electronic Structure J. Am. Chem. Soc. 2008, 130, 13417-13424
34. Pennycook, S. J.; Colliex, C. Spectroscopic Imaging in Electron Microscopy MRS Bull. 2012, 37, 13-18
35. Warwick, T.; Ade, H.; Kilcoyne, A. L. D.; Kritscher, M.; Tyliszczak, T.; Fakra, S.; Hitchcock, A. P.; Hitchcock, P.; Padmore, H. A. A New Bend Magnet Beam Line for Scanning Transmission X-ray Microscopy at the Advanced Light Source J. Synchrotron Rad. 2002, 9, 254-257
36. Kilcoyne, A. L. D.; Tyliszczak, T.; Steele, W. F.; Fakra, S.; Hitchcock, P.; Franck, K.; Anderson, E. K.; Harteneck, B.; Rightor, E. G.; Mitchell, G. et al. Interferometrically Controlled Scanning Transmission Microscopes at the Advanced Light Source J. Synchrotron Rad. 2003, 10, 125-136
37. Watts, B.; Ade, H. A Simple Method for Determining Linear Polarization and Energy Calibration of Focused Soft X-Ray Beams J. Electron Spectrosc. Relat. Phenom. 2008, 162, 49-55
38. Kaznatcheev, K. V.; Karunakaran, Ch.; Lanke, U. D.; Urquhart, S. G.; Obst, M.; Hitchcock, A. P. Soft X-ray Spectromicroscopy Beamline at the CLS: Commissioning Result s Nucl. Instrum. Methods A 2007, 582, 96-99