AFM lateral force calibration for an integrated probe using a calibration grating

Ultramicroscopy

Volumn 136, Issue , 2014, Pages 193-200

  Wang, Huabin ^a   Gee, Michelle L ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

Atomic force microscopy; Calibration; Calibration grating; Friction; Lateral force

Indexed keywords

BOUNDARY LUBRICATIONS; CALIBRATION GRATINGS; FRICTION CALIBRATIONS; FRICTION MEASUREMENTS; HETEROGENEOUS SURFACE; LATERAL FORCE; LATERAL FORCE CALIBRATION; SPATIAL RESOLUTION;

ATOMIC FORCE MICROSCOPY; FRICTION; PROBES; TRIBOLOGY;

CALIBRATION;

ACCURACY; ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; FEEDBACK SYSTEM; FORCE; LUBRICATION; MATHEMATICAL ANALYSIS; QUANTITATIVE ANALYSIS; RELIABILITY; SIGNAL NOISE RATIO; SYSTEMATIC ERROR; TOPOGRAPHY;

EID: 84887182513     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.10.012     Document Type: Article

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