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Langmuir

Volumn 27, Issue 8, 2011, Pages 4635-4644

Noncontact method for calibration of lateral forces in scanning force microscopy

(3) Wagner, Kyle a Cheng, Peng a Vezenov, Dmitri a

a LEHIGH UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION METHOD; CALIBRATION PROCEDURE; FORCE CALIBRATION; IN-SITU; LATERAL CALIBRATION; LATERAL FORCE; LATERAL FORCE MICROSCOPY; NON-CONTACT; NONCONTACT METHODS; OPTICAL MICROSCOPES; SCANNING FORCE MICROSCOPY; SENSITIVITY VALUES; SPRING CONSTANTS; THERMAL SPECTRA; THERMAL-NOISE SPECTRUM; VISCOUS FLUIDS;

AIR; NANOCANTILEVERS; SCANNING TUNNELING MICROSCOPY; THERMAL NOISE;

CALIBRATION;

EID: 79953899210 PISSN: 07437463 EISSN: 15205827 Source Type: Journal
DOI: 10.1021/la1046172 Document Type: Article

Times cited : (84)

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