An improved wedge calibration method for lateral force in atomic force microscopy

Review of Scientific Instruments

Volumn 74, Issue 7, 2003, Pages 3362-3367

  Varenberg, M ^a   Etsion, I ^a   Halperin, G ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; CALIBRATION; NATURAL FREQUENCIES; STIFFNESS;

WEDGE CALIBRATION;

ATOMIC FORCE MICROSCOPY;

EID: 0042266906     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1584082     Document Type: Article

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